Matthew A. Thompson, Ph.D., executive director of the Principal Solar Institute, presented the poster, “Lifetime Energy Production™ – A Simple Method for PV Module Comparison” during the PV America 2014 conference.
Selected by industry experts as one of the Best Posters of PV America, the poster details how the PV Module Rating provides a quick and simple method for side-by-side comparison of photovoltaic (PV) modules to maximize return-on-investment and enhance the value of a solar project.
Register to watch the presentation recording (skip to 14:30 in the video)
Please register above to view this Webinar.
Matthew Thompson is a scientist with 23 years experience in semiconductor process development and yield enhancement at Motorola and at Freescale Semiconductor.
At Motorola's Advanced Process Development Laboratory, he developed vertical gate oxidation processes and equipment. In a collaborative research and development project that included Motorola and IBM, he designed Synchrotron x-ray optics for deep submicron lithography, and supported x-ray mask design. The project culminated with a successful fabrication of fully functional memory chips using x-ray lithography. In another industry research project, Matthew worked with Motorola and Lucent Technologies to develop 200 mm mask manufacturing processes for a novel projection electron beam lithography technique. In addition to these advanced lithography research projects, he developed computer algorithms for Complimentary Phase Shift Masks, leading to volume manufacture of products with 50 nm gates using 248 nm imaging tools. At Freescale Semiconductor, he worked to improve profitability and performance by development and deployment of Design for Manufacturability methodology.
Matthew earned a B.S. in Physics at Texas Tech University, and a Ph. D. in Physics at The University of Texas at Austin. He holds seven patents in areas such as electronic design processing, x-ray mirror design, and advanced e-beam lithography, optical photo mask design and microcircuit pre-failure detection.